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X-ray Photoemission & Low Energy Electron Microscope
This X-ray Photoemission and Low Energy Electron Microscope (XPLEEM) has been developed for small laboratory or synchrotron-related applications. Several methods of excitation of the specimen surface can be used for getting the image, namely, electron beam, UV light, synchrotron monochromatized soft X-rays and hard X-rays.
Technical Specification
modes of operation | MEM, LEEM, LEED, Scanning LEEM, PEEM, XPEEM, microESCA |
nominal operational voltage | 15 kV |
UHV operating conditions | |
minimal / maximal outgoing electron energy | <0 / 1000 eV |
minimal / maximal field of view | 1 / 100 μm |
range of magnification | 200–130,000 |
source of electrons | field emitter |
energy spread of the field emitter | 0.6 eV |
spatial resolution | better than 10 nm (LEEM mode) |
electric field at the sample | 50 kV / cm |
specimen heating | up to 1,800 K (electron bombardment) |
specimen cooling | down to 80 K |
range of specimen translations / reproductibility | 5 mm / 5 µm |
dimensions of the specimen | Ø 10 mm / thickness up to 1 mm |
channelplate screen (pixel size) | 12 µm |
YAG | Ø 38 mm / thickness 0.5 mm |